Quality: Quality Measurement at the Push of a Button

Chicago, Illinois - Recent advances in measurement and quality data management software, coupled with low cost computers and advanced non-contact sensor technologies, have enabled the creation of measurement solutions that enable a job shop or global manufacturer to realize this desire. The ease of use of today’s software supports the development of a competent, local workforce that ultimately lowers the cost of local manufacturing.

This conference session will cover lessons learned of how combinations of these new technologies are enabling manufacturing companies to measure more and faster, with trustworthy results, and use that information to drive quality improvement.

About the speaker

David Wick is the manager, product management at ZEISS Industrial Metrology where he leads a team responsible for bringing new hardware and software solutions to market that solve customer manufacturing challenges. 

Prior to joining ZEISS, Mr. Wick held a series of leadership positions in applications engineering, business development and product management at the Precision Sensors business unit of Honeywell International. He holds a BSEE degree from the University of Minnesota and an MBA in Marketing from the University of St. Thomas.