Quality - ZEISS

2018 IIC Conference - Presentations

July 26, 2016

Monday, 9/12

3:15 to 4:10 p.m. / W-193-A

Session Topic: Quality Measurement of the Push of a Button

Every manufacturing company desires to quickly get stable measurement results from an easy-to-use inspection system, and then turn ever-increasing amounts of data into meaningful information that drives quality improvement.

Recent advances in measurement and quality data management software, coupled with low-cost computers, and advanced non-contact sensor technologies, have enabled the creation of measurement solutions that enable a job shop or global manufacturer to realize this desire. The easy use of today’s software supports the development of a competent, local workforce that ultimately, lowers the cost of local manufacturing.

This conference session will cover lessons learned regarding how combinations of these new technologies are enabling manufacturing companies to measure more and faster, with trustworthy results, and use that information to drive quality improvement.

David Wick

Manager, Product Management
Zeiss Industrial
Metrology LLC

David Wick is the manager, product management at Zeiss Industrial Metrology LLC where he leads a team responsible for bringing new hardware and software solutions to solve customer manufacturing challenges.

Zeiss is an internationally leading technology enterprise operating in the optics and optoelectronics industries. The Industrial Metrology business group is a leader in CNC coordinate measuring machines and complete solutions for multidimensional metrology in the metrology lab and production. The microscopy business group is the world’s only one-stop manufacturer of light, X-ray, and electron microscope systems with a portfolio that includes solutions for materials research and industry.

IMTS 2016 Booth #E-5502 & #NC-506