
GIE Media's Manufacturing Group
Wednesday September 11 2:15 PM CST
IMTS48 Room W192-C
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Multisensor metrology systems provide the advantage of complete 3D measurement data from a single measuring machine. A modern multisensor system combines optics, contact probes (touch trigger and scanning), laser and micro-probes, along with advanced lighting and motion control, for total part characterization. These systems offer highly accurate measurement results in a fraction of the time and cost it would take to do on separate measuring systems, and in a fraction of the space required for multiple measuring systems.
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