3D optical surface measuring systems

Designed to provide fast non-contact 3D scanning and evaluation of very small- to medium-sized surface details on a wide range of components, including optics, the MarSurf WM 100 uses a white light interferometer, and the MarSurf CWM 100 includes both white light and confocal microscopy. The systems are designed for measuring optical, technical, and reflecting surfaces to provide 3D topographical analysis where high information-density is required.

The MarSurf CWM 100 and WM 100 provide highly accurate, non-contact measurement of surface structures with sub-nanometer resolution. Confocal microscopy is more adept at the measurement of dark surface structures, including the edges of small components, while white light interferometry is better suited to highly polished, shiny surfaces, including glass and optical surfaces.

White light scanning sensors are designed for fast-paced 3D roughness measurement, using real time video scanning technology for high-resolution reproduction of microscopic surface details. They come standard with a 20x lens, with others available ranging from 2.5x to 100x, and provide resolution down to 0.1nm.

The confocal microscope available with the CWM 100 provides measurement of both 2D and 3D parameters to international standards along selectable surface lines or areal extracts. A 50x confocal lens is included, with others available. The CNC controlled object table and Z-axis provide 100mm traversing range.

A detailed brochure on the MarSurf CWM 100 is available at http://bit.ly/1wIPL6l.

A detailed brochure on the MarSurf WM 100 is available at http://bit.ly/1sjFc8e.

Mahr Federal Inc.
www.mahr.com