Countdown to IMTS 2010: Veeco Instruments

In booth# E-5439 at IMTS 2010, Veeco Instruments Inc. will display its NPFLEX™ 3D Metrology System for characterizing surfaces previously too difficult to measure due to size or part orientation. The NPFLEX 3D surface profiler combines the industry-leading performance of Veeco’s non-contact, white light optical profilers with a unique open-access design to enable rapid, three-dimensional data acquisition and analysis on a wide range of large samples for precision machining applications in the medical implant, aerospace, and automotive market sectors.

The NPFLEX utilizes a breakthrough gantry design to provide over 300 degrees of access for large samples. The unique option of a swiveling optical head permits routine investigation of highly curved samples and beveled edges. The system’s white light interferometric technology provides greater accuracy, repeatability and, more importantly, data density than is possible with contact instrumentation. Other standard features include long working distance objectives, a proprietary objective crash-mitigation system, automation and field-stitching software, and patent-pending, ultra-uniform dual-LED illumination. Running on the industry-leading Vision® software platform, the NPFLEX provides access to over 200 distinct analyses, and over 1000 critical parameters for measuring curvature, lay, bearing ratio, wear, corrosion, and other critical parameters.