Improving ROI of Automated Metrology Aided Manufacturing Using Laser Radar Technology
IMTS Conference Topic on Wednesday, September 12, 11:00am to 11:55am
Jon Koepl, Senior Sales Specialist, Large Scale Metrology, Nikon Metrology, will present, Improving ROI of Automated Metrology Aided Manufacturing Using Laser Radar Technology during the IMTS 2012 Conference sessions.
Plan on attending these educational and informative sessions – running September 10-14, 2012 in the West Building, Level 1 – by registering today.
Sessions explore innovative as well as revered technologies, business development, and optimization, plus workforce efficiency and productivity. Special emphasis is on maintaining focus on your short- and long-term goals during a tough economic environment. Buffet lunch is included for all conference attendees.
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