Thermo Fisher Scientific desktop scanning electron microscope (SEM) solution

Thermo Fisher Scientific desktop scanning electron microscope (SEM) solution

September 27, 2019

Thermo Fisher Scientific

https://www.phenom-world.com/
3D/Additive/Alternative Materials Quality/Metrology

Thermo Fisher Scientific’s Phenom ParticleX desktop scanning electron microscope (SEM) solution provides additive manufacturing (AM) companies faster quality control analyses of materials used to develop automotive parts or other products. The Phenom ParticleX includes a broad range of automated SEM analyses to identify faults in materials or gauge the impact development and production changes have on a final product. By keeping production continuity and quality control in-house, the Phenom ParticleX users can analyze materials up to 10x faster than outsourcing.

The high-resolution imaging and chemical analysis capabilities in the Phenom ParticleX delivers more detailed failure analyses than is possible using optical microscopes. Additive manufacturers can characterize size distribution, particle homogeneity and foreign contaminants to evaluate the purity of metal particles at the microscale. Industrial manufacturers can use it to confirm components that fulfill technical cleanliness specifications according to the VDA19 or ISO16232 standards. It also provides detailed feedback on the cleanliness or purity of final product without having to share this confidential and valuable data with third parties.